CL-20 Sensitivity Round Robin

Abstract

The objectives of the Navy's CL-20 Manufacturing Technology project are to develop and implement advanced process technology that will improve the reproducibility and quality of CL-20, improve CL-20 sensitivity, and reduce the cost of CL-20. One subtask in this project was the identification of key factors and properties that influence the sensitivity of CL-20. A series of round robin tests was conducted where impact and friction sensitivity testing were run on 14 samples of CL-20. These samples were prepared using various synthesis and/or recrystallization techniques and having various impurity levels. Samples were supplied by the U.S. commercial supplier, ATK Thiokol Propulsion Company, the Navy (Naval Surface Warfare Center, Indian Head Division, and Naval Air Warfare Center Weapons Division, China Lake), and the Army (TACOM-ARDEC) as well as Aerojet and suppliers from outside the United States (Nexplo-Bofors and SNPE). Round robin results indicate that CL-20 sensitivity is largely unaffected by CL-20 preparation method, purity, and particle characteristics.

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Document Details

Document Type
Technical Report
Publication Date
Apr 25, 2003
Accession Number
ADA415096

Entities

People

  • Nancy C. Johnson

Organizations

  • Naval Surface Warfare Center Indian Head Division

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Aerial Warfare
  • Crystallization
  • Crystals
  • Friction
  • Identification
  • Impact Tests
  • Impurities
  • Liquid Chromatography
  • Manufacturing
  • Materials
  • Particle Size
  • Particles
  • Sliding Friction
  • Surface Warfare
  • Test Facilities
  • Test Methods
  • Warfare

Readers

  • Maritime and Naval Warfare Studies
  • Rocket Propulsion.
  • Semiconductor Device Technology