Controlled Nucleation and Growth in Semiconductor Epitaxy
Abstract
During Phase 1 support two types of ultrasonic transducers were designed and fabricated. These transducers were utilized for ultrasonically assisted deposition of silicon under Molecular Beam Epitaxy (MBE). Epitaxial Si growth on (100) Si wafers has been observed at reduced substrate heater temperatures when accompanied by simultaneous ultrasonic agitation of the substrate during deposition.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 2003
- Accession Number
- ADA415932
Entities
People
- Chia-gee Wang