Deep Level Transient Spectroscopy Study of Defects and Impurities in GaN and Related III-N Materials

Abstract

The new system, for the first time, uses powerful Microsoft Windows Software for various options of DLTS measurements and data analyses. However, Phys Tech, which is a contractor of Accent and responsible for writing the software, did not provide us with a detailed manual of the DLTS Software until July of this year (we only received a draft of the Software manual in July). Therefore, we still have to learn how to operate the system in detail.

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Document Details

Document Type
Technical Report
Publication Date
Aug 29, 2003
Accession Number
ADA418082

Entities

People

  • D. C. Look

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Air Force
  • Contractors
  • Cryostats
  • Data Analysis
  • Electronics
  • Fourier Transformation
  • Impurities
  • Information Operations
  • Materials
  • Measurement
  • Operating Systems
  • Personnel Management
  • Semiconductors
  • Silicon Carbide
  • Spectroscopy
  • Wide Bandgap Semiconductors

Fields of Study

  • Computer science

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  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Technical Research and Report Writing.