X-Ray Diffractometer for the Analysis of Structure and Thermal Stability of Nanolaminate Thin Films

Abstract

During this period of time, the authors purchased a new x-ray diffractometer and related hardware and installed the new instrumentation. The new equipment is working extremely well and has made a significant impact on their research efforts. Their research focuses on the fabrication of nanolaminates with atomic layer deposition (ALD) techniques based on sequential self-limiting surface chemistry. They also are concentrating on measuring the properties of nanolaminates. Nanolaminates are multi-layered thin film structures with very high interfacial density. These composite multi-layer structures can display interesting properties that are not observed in the individual components. These special properties can be optimized by manipulating the thickness and composition of the individual nanolayers. The optimized nanolaminates may have important applications as protective coatings and thin films with enhanced optical, mechanical, and electrical properties. (3 figures)

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Document Details

Document Type
Technical Report
Publication Date
Aug 20, 2003
Accession Number
ADA419566

Entities

People

  • Steven M. George

Organizations

  • University of Colorado Boulder

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Chemical Engineering
  • Chemistry
  • Crystal Structure
  • Diffraction
  • Diffractometers
  • Electrical Properties
  • Films
  • High Resolution
  • Instrumentation
  • Measurement
  • Protective Coatings
  • Surface Chemistry
  • Thermal Stability
  • Thickness
  • Thin Films
  • X Rays
  • X-Ray Diffraction

Readers

  • Thin Film Deposition Science.