Low Temperature Alpha Measurement

Abstract

The objective of this task was to provide for the setup, measurement and data analysis of an experiment to measure the alpha parameter of diode lasers. The alpha parameter oharacterized the degree of coupling between the diode laser carriers and the material index of refraction. This parameter has been measured extensively at room temperature and this task extended the measurement regime to low temperatures.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2001
Accession Number
ADA419916

Entities

People

  • David J. Gallant

Organizations

  • Boeing

Tags

Communities of Interest

  • Energy and Power Technologies
  • Human Systems

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Antireflection Coatings
  • Coatings
  • Couplings
  • Data Analysis
  • Laser Diodes
  • Lasers
  • Low Temperature
  • Materials
  • Measurement
  • Optical Coatings
  • Refraction
  • Refractive Index
  • Semiconductor Lasers
  • Semiconductors
  • Vacuum Chambers

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Electronics Engineering
  • Thermal Physics or Thermal Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers