Issues of Compatibility Between Nanomaterials and Aluminum Scanning Electron Microscopic Mounts

Abstract

Aluminum mounts are ubiquitously present in scanning electron microscope (SEM) laboratories. They are an inexpensive light material with good conductivity properties, and are generally compatible with conductive adhesive products. In the course of using aluminum mounts to examine nanoscale materials, some compatibility issues were revealed. One limiting issue was charge conduction. Nanoscale materials can be a more efficient conductor of electrons than the aluminum mount with its layer of oxides. The design of the SEM can constrain charge dissipation. These topics are discussed in summarized form using examples from nanotube dispersion research.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 2004
Accession Number
ADA429378

Entities

People

  • Donovan Harris

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Aluminum
  • Carbon Nanotubes
  • Chlorides
  • Conductivity
  • Dispersions
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Films
  • Fullerenes
  • Materials
  • Materials Laboratories
  • Microscopes
  • Military Research
  • Nanomaterials
  • Scanning
  • Scanning Electron Microscopes

Fields of Study

  • Materials science
  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Plasma Physics.
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics