Measurements of Secondary Electron Yield From Materials With Application to Depressed Collectors
Abstract
This final technical report summarizes the research activities over the last year of this grant. New time-dependent secondary electron yield (S.E.Y) measurements, including both true secondary emission and backscattering, have been made on materials thought to be suitable for low yield vacuum electronic applications such as collectors in High Power Microwave (HPM) tubes and beam-facing components in particle accelerators. Measurements of the angular dependence of S.E.Y. have also been performed and compared well with the literature. Boron-carbide-sprayed copper substrates, provided by Calbazas Creek Research, Inc., have also been initially characterized, and will be presented in a paper at IVEC 2005. The dependence of true secondaries on incident beam energy has been measured, but its intepretation has yet to be cormpleted. These 0pen questions will be resolved under the auspices of a follow-on grant.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 22, 2005
- Accession Number
- ADA433606
Entities
People
- Edi Schamiloglu
- Mark Gilmore
Organizations
- University of New Mexico