Improvements in Mechanical Detection of Magnetic Resonance

Abstract

This program intended to provide substantial improvements to conditions that affect imaging nanoscale structures with atomic resolution and chemical specificity by magnetic resonance force microscopy. This is a final report of an 18 months effort. During this period we the following activities: We increased the sensitivity of the cantilever displacement readout and therefore the force sensitivity achievable with mechanical detection. We implemented an approach to reduce the spin noise in MRFM by shifting to higher frequencies the higher order cantilever vibrational modes. We build a low temperature microscope that operates in vacuum at 4K in a field of up to 9Tesla and tested the system. Finally, we selected CaF2 as the first sample to test the feasibility of performing magnetic resonance force spectroscopy within the resonance slice, prepared samples and characterized the sample.

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Document Details

Document Type
Technical Report
Publication Date
Apr 18, 2005
Accession Number
ADA433722

Entities

People

  • Raul Fainchtein

Organizations

  • Johns Hopkins University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Detection
  • Detectors
  • Displacement
  • Frequency
  • Interferometers
  • Low Temperature
  • Magnetic Resonance
  • Materials
  • Measurement
  • Microscopes
  • Microscopy
  • Physics
  • Physics Laboratories
  • Refractive Index
  • Resonance
  • Sensitivity
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Aerospace Test and Evaluation
  • Mathematics or Statistics
  • Nanoscale Plasmonic Nanotechnology