Mixed Anion Heterostructure Materials

Abstract

Inhibition of anion exchange reactions during molecular beam epitaxy is critical to the synthesis of mixed-anion heterojunction interfaces. These interfaces are the basic structural building blocks of advanced electronic and optoelectronic devices that are critical to DoD applications. Anion exchange is a key surface and subsurface reaction leading to interfacial intermixing. Other related reactions include segregation, diffusion, and clustering. Interfacial intermixing results in uncontrolled strain and related bandstructure modifications that degrade device performance, reliability, and manufacturability. This project represents a study, both experimentally and theoretically, of the fundamental structural properties and process conditions that drive anion exchange and related reactions. Our techniques are applied to As-, P-, and Sb-based mixed anion heterostructures, as well as to enable the control of anion exchange to Sb/As device materials.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 2004
Accession Number
ADA436288

Entities

People

  • April S. Brown
  • Gary S. May
  • Z. L. Wang

Organizations

  • Georgia Tech Research Corporation

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force Research Laboratories
  • Chemical Reactions
  • Compound Semiconductors
  • Epitaxial Growth
  • Exchange Reactions
  • Heat Of Formation
  • Heterojunctions
  • Manufacturing
  • Materials
  • Molecular Beam Epitaxy
  • Molecular Beams
  • Neural Networks
  • Optoelectronic Devices
  • Semiconductor Devices
  • Semiconductors
  • Solid State Electronics
  • Thermodynamics

Fields of Study

  • Materials science

Readers

  • Quantum Chemistry
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics