Reliability of Systems Using Event Occurrence Networks

Abstract

The study of a system's reliability has played a crucial role in business and industry since the dawn of modern technology. Current graphical models utilized in reliability theory are limited in that no one model or technique allows for a thorough analysis of system reliability. This research introduces a new graphical model and methodology to be used in the field of reliability that addresses this concern. Event Occurrence Networks (EONs) and their solution methodologies provide an all-inclusive graphical model that allows for the manipulation of several important reliability measures. An EON is a probabilistic network that represents the superposition of several terminating counting processes and is an efficient tool in both non-repairable and repairable systems. Current methodologies are also restricted in the distributions that characterize component life and repair times. This concern is alleviated via EONs coupled with piecewise polynomial approximation.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2006
Accession Number
ADA445182

Entities

People

  • Gregory M. Steeger

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Energy and Power Technologies
  • Human Systems
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Complex Systems
  • Computational Science
  • Department Of Defense
  • Differential Equations
  • Equations
  • Failure Mode And Effect Analysis
  • Markov Chains
  • Mathematical Models
  • Operations Research
  • Probabilistic Models
  • Probability
  • Random Variables
  • Stochastic Processes
  • Time Intervals
  • United States Government

Readers

  • Statistical inference.
  • Systems Analysis and Design