Observation of Dihalide Elimination Upon Electron Attachment to Oxalyl Chloride and Oxalyl Bromide, 300-550 K
Abstract
Rate coefficients have been measured for electron attachment to oxalyl chloride and oxalyl bromide in He gas at 133 Pa pressure over the temperature range of 300-550 K. With oxalyl chloride, the major ion product of attachment is Cl2 at all temperatures; its importance increases slightly as temperature increases. Two other product ions formed at Cl and the phosgene anion CCl2O and appear to arise from a common mechanism. With oxalyl bromide, the Br2 channel represents almost half of the ion product of attachment, independent of temperature. Br accounts for the remainder. For oxalyl chloride, the attachment rate coefficient is small, and increases with temperature. The attachment rate coefficient for oxalyl bromide is nearly collisional and increases only slightly with temperature.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 10, 2006
- Accession Number
- ADA449238
Entities
People
- Albert A Viggiano
- Jane M. Van Doren
- Kathleen B. Hogan
- Thomas M Miller
Organizations
- Air Force Research Laboratory