Fabrication and Characterization of Electric Field - Induced Resistive Sensor at the end of Scanning Probe Tip

Abstract

Fabrication and Characterization of Electrical Field were investigated to develop induced Resistive Sensor at the end of Scanning Probe Tip. The measurement and visual observation of doping profile were performed on Kelvin Prove Force Microscopy (KPFM) & Scanning Nonlinear Dielectric Microscopy (SNDM). NiO Film was fabricated and characterized for Memory Switching applications. Last, effects of Surface Treatment on Work Function & in-plane conductivity of ITO (Indium Tin Oxide) Thin Films were also investigated.

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Document Details

Document Type
Technical Report
Publication Date
Jul 27, 2006
Accession Number
ADA454183

Entities

People

  • Hyunjung Shin

Organizations

  • Kookmin University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Advanced Materials
  • Conductivity
  • Data Storage Systems
  • Electric Fields
  • Electromagnetic Fields
  • Fabrication
  • Films
  • Materials
  • Materials Engineering
  • Materials Science
  • Measurement
  • Microscopy
  • Organic Light Emitting Diodes
  • Semiconductors
  • Surface Finishing
  • Thin Films
  • Work Functions

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Nanoscale Plasmonic Nanotechnology
  • Thin Film Deposition Science.