Synchrotron Based X-Ray Strain Mapping in Fatigued Materials Subjected to Overloading

Abstract

The application of high-resolution strain mapping in large engineering samples with both high-spatial and strain resolution is reviewed in this report using high- energy photons between 100 and 300 KeV on beam line X17B1 of Brookhaven National Laboratory. This was achieved by using Energy Dispersive X-ray Diffraction (EDXRD) methods and synchrotron radiation for the nondestructive measurement of residual stresses in engineering components. Examples of residual stresses profiles will be presented which include: laser and shot peening and fatigue crack stress fields. The presented results have been validated with other methods such as FE and other model predictions. This technique represents a significant development in the in life prediction of engineering structures including large naval structures.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2006
Accession Number
ADA455073

Entities

People

  • K. Sadananda
  • Mark C. Croft
  • R. Holtz
  • Thomas Tsakalakos
  • Zhaohui Zhong

Organizations

  • Rutgers University–New Brunswick

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Crack Tips
  • Crystal Lattices
  • Crystallography
  • Detectors
  • Diffraction
  • Failure Mode And Effect Analysis
  • High Resolution
  • Laser Peening
  • Light Sources
  • Materials
  • Materials Science
  • Mechanics
  • Scattering
  • Shot Peening
  • Synchrotron Radiation
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Solar Physics
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Directed Energy