Adhesion Measurements of Thin Films in Corrosive Environments

Abstract

With the use of thin films reaching a wide variety of applications, it is important to know how thin films will hold up in a variety of environmental conditions. Here, water effects on thin film adhesion were studied on copper and diamond like carbon (DLC) films. Regardless of the film being considered, it is usually advantageous to have a thin film that adheres well to its substrate. Because of the potentially harsh environments that thin films may be introduced to during their processing or use, the effect of water on thin film adhesion need to be further studied. There are several methods currently being used to measure the adhesion of thin films which include the following: four-point bend test, indentation, scratch and pull off tests. Here we used the superlayer indentation test for adhesion measurements in the dry environment. For measuring film adhesion in a wet environment a modified version of the superlayer nanoindentation test was developed. Quantitative adhesion tests yield the practical work of adhesion, or strain energy release rate, C, value. When C is greater than the material's resistance to crack growth, F, crack propagation will occur. The formerly stated is the Griffith criterion and can also be applied to interfacial fracture.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 2006
Accession Number
ADA456174

Entities

People

  • Alex A. Volinsky
  • Patrick Waters

Organizations

  • University of South Florida

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Crack Tips
  • Environment
  • Fabrication
  • Films
  • Manufacturing
  • Materials
  • Materials Science
  • Measurement
  • Mechanical Engineering
  • Mechanical Properties
  • Mechanics
  • Micro-Machines
  • Nanomaterials
  • Residual Stress
  • Steady State
  • Stresses
  • Thin Films

Readers

  • Materials Science (Mechanical Engineering).
  • Systems Analysis and Design
  • Thin Film Deposition Science.