Single Pulse Emittance Measurement Technique for Intense Relativistic Electron Beam

Abstract

A study of emittance measurements using a slit pinhole type emittance meter is conducted using a 1 MeV, 18 ka electron beam. The beam is passed through titanium foils of varying thickness and the emittance is measured downstream. Two different types of emittance masks are used - one composed of tantalum bars with knife edges and another using cylindrical bars of elkonite. The prototype is used to measure the rms emittance and the projected phase space density of a nominal 1 MeV, 16 ka, 25 ns FWHM electron beam. Data is collected optically using an open shutter camera with polaroid film (time integrated). In addition, time resolved data is presented using a gated optical imaging ccd system on a 5 MeV IREB. This study sets a bound on the measurement accuracy to be expected when using this method of data collection and illustrates the effects of two different mask designs.

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Document Details

Document Type
Technical Report
Publication Date
May 16, 1997
Accession Number
ADA457945

Entities

People

  • J. A. Antoniades
  • J. A. Gregor
  • R. M. Meger

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Boundaries
  • Cameras
  • Charged Particles
  • Electron Beams
  • Electrons
  • Emission
  • Equations
  • Measurement
  • Military Research
  • Particle Accelerators
  • Particle Beams
  • Space Charge
  • Spreadsheet Software
  • Thickness
  • Titanium
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Microelectronics
  • Space