Calibration and Verification Procedures at ARL for the Focus Microwaves Load Pull System

Abstract

When evaluating the performance of technologically innovative microwave devices, it is important to be able to validate the performance of the system performing the measurements. The theory behind the measurements used in recent Army Research Laboratory testing of the Gallium Nitride high electron mobility transistor devices is described. The verification of calibration used in the measurement is outlined in detail, including a metric by which the accuracy of the validation can be judged.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 2006
Accession Number
ADA458331

Entities

People

  • Benjamin D. Huebschman

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Calibration
  • Compound Semiconductors
  • Delay Lines
  • Electrons
  • Elements
  • Equations
  • Measurement
  • Microwaves
  • Military Research
  • Power Measurement
  • Power Meters
  • Semiconductors
  • Transistor Amplifiers
  • Transistors
  • Verification
  • Verification Tests

Fields of Study

  • Physics

Readers

  • Computational Fluid Dynamics (CFD)
  • Semiconductor Device Technology
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems