Thermoreflectance Imaging of Superlattice Micro Refrigerators
Abstract
High resolution thermal images of operating micro refrigerators are presented. Using the thermo reflectance method and a high dynamic range PIN array camera, thermal images with 50mK thermal resolution and high spatial resolution are presented. This general method can be applied to any operating semiconductors, and can be used as a tool for identifying fabrication failures. With further optimization of the experimental setup, we expect to achieve sub-micron spatial resolution thermal images.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 2001
- Accession Number
- ADA461899
Entities
People
- Ali H. Shakouri
- Chris Labounty
- Daryoosh Vashaee
- Edward T. Croke
- Gehong Zeng
- James Christofferson
- John E. Bowers
- Philip Melese
- Xiaofeng Fan
Organizations
- University of California, Santa Cruz