Slip Activity in Commercial Purity Titanium (CP Ti)

Abstract

In the first delivery the microstructure of the CP-Ti specimen provided by The Metals Processing Group of Dr Lee Semiatin at the AF Research Laboratory in WPAFB, OH, was determined by X-ray line profile analysis (XLPA). In the second delivery About 12 smaller cubes were cut from the material by a diamond saw. Two deformation states were produced by the method of abc deformation, where the deformation stage was 10 and 20 % respectively. Four different kinds of X-ray diffraction experiments were carried out. High resolution laboratory and special synchrotron X-ray diffraction techniques were used to characterize slip and twinning activity in extruded billets of commercial-purity (CP) titanium.

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Document Details

Document Type
Technical Report
Publication Date
Sep 20, 2006
Accession Number
ADA462958

Entities

People

  • Tamas H. Ungar

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Crystal Structure
  • Crystallites
  • Detectors
  • Diameters
  • Diffraction
  • Diffractometers
  • Electron Microscopy
  • Geometry
  • High Resolution
  • Ion Beams
  • Materials
  • Metals
  • Microscopes
  • Scanning Electron Microscopy
  • Titanium
  • X Rays
  • X-Ray Diffraction

Readers

  • Materials Science and Engineering.
  • Powder metallurgy of Titanium alloys.