Electron Transport in Si Nanowires
Abstract
We investigate electron transport in silicon nanowires taking into account acoustic, non-polar optical phonons and surface/interface roughness scattering. We find that at very high transverse fields the reduced density of final states to which the carriers can scatter into gives rise to a reduced influence of interface-roughness scattering, which is promising result from a fabrication point of view.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2006
- Accession Number
- ADA464534
Entities
People
- Dragica Vasileska
- E. Ramayya
- I. Knežević
- Stephen M. Goodnick
Organizations
- Arizona State University