Improved Electrical Properties of Epoxy Resin with Nanometer-Sized Inorganic Fillers (Preprint)

Abstract

In this study, the average dielectric breakdown voltage of POSS-filled epoxy was increased 34 percent compared to unloaded epoxy. Additionally, scanning electron microscopy showed uniform dispersion of the POSS filler down to a level of 10-100 nm. Dispersion uniformity appears to be a critical parameter in obtaining the desired property enhancements.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 2006
Accession Number
ADA464807

Entities

People

  • Amanda Schrand
  • Daniel L. Schweickart
  • Donald Klosterman
  • Guido Garcia
  • John C. Horwath
  • Lawrence C. Walko
  • Mary Galaska

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Dispersions
  • Electrical Properties
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Epoxy Resins
  • Materials
  • Materials Laboratories
  • Materials Testing
  • Microscopy
  • Nanoparticles
  • Plastics
  • Polymers
  • Resins
  • Scanning Electron Microscopy

Fields of Study

  • Materials science

Readers

  • Computational Modeling and Simulation
  • Polymer Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene