Molecular Volume and Electronic and Vibrational Polarizibilities for Amorphous LaAlO3
Abstract
Grazing incidence x-ray reflectivity measurements are used to determine the density of sputter-deposited LaAlO and anodized LaAl films. Together with refractive index and dielectric constant measurements, it is demonstrated that a coherent picture emerges explaining the low dielectric constant of the amorphous films (~13) as compared to the single-crystal value (~26). The importance of molecular volume dependence of the electronic and vibrational molecular polarizabilities is underlined.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 2004
- Accession Number
- ADA466053
Entities
People
- R. A. Devine
- T. Busani
Organizations
- Air Force Research Laboratory