Microfabrication of a Mechanically Controllable Break Junction in Silicon
Abstract
The authors present a detailed description of the microfabrication and operation at room temperature of a novel type of tunnel displacement transducer. Instead of a feedback system, it relies on a large reduction factor, assuring an inherently stable device. Stability measurements in the tunnel regime infer an electrode stability within 3 pm in a 1 kHz bandwidth. In the contact regime, the conductance takes on a discrete number of values when the constriction is reduced atom by atom. This reflects the conduction through discrete channels.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 21, 1995
- Accession Number
- ADA466432
Entities
People
- Caroline J. Muller
- Chong Zhou
- J. W. Sleight
- M. A. Reed
- M. R. Deshpande
Organizations
- Yale University