Increasing the Laser Induced Damage Threshold of Single Crystal ZnGeP2
Abstract
The laser induced damage threshold (LIDT) of single crystal zinc germanium phosphide (ZGP), ZnGeP2, was increased to 2 J/cm2 at 2.05 microns and 10 kHz pulse rate frequency (double the previously measured value of 1 J/cm2). This increased LIDT was achieved by improving the polishing of ZGP OPO crystals. The surface preparation of ZGP samples was determined to be of great importance because laser-induced damage has been observed to always initiate at the surface rather than in the bulk of the material. Two different polishing techniques were evaluated by comparing the surfaces of ZGP samples fabricated in the same manner apart from the polishing stage. Surfaces were characterized using scanning white light interferometry (SWLI) in order to determine RMS surface roughness and sample flatness. The photon backscatter technique (PBS) was used to determine the degree of surface and subsurface damage in the sample induced through the fabrication process. Both uncoated and anti-reflection coated samples were damage tested. The effect of subsurface damage in the samples was studied by removing different amounts of material during polishing for otherwise identical samples. The amount of material removed was correlated to the observed LIDT. Statistical LIDT was measured using a high-average-power, repetitively Q-switched Tm,Ho:YLF 2.05-micron pump laser. On average, lower surface roughness and photon backscatter measurements was a good indicator of ZGP samples exhibiting higher LIDT. The removal of more material during polishing significantly improved the LIDT of otherwise identical samples, indicating the importance of subsurface damage defects in the LIDT of ZGP.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 2006
- Accession Number
- ADA466914
Entities
People
- Kevin T. Zawilski
- Peter G Schunemann
- Scott D. Setzler
- Thomas M. Pollak
Organizations
- Air Force Research Laboratory