On the Importance of Atomic Packing in Determining Dielectric Permittivities

Abstract

The role of the network structure in determining the dielectric constant of binary and ternary oxide insulators is outlined. Seemingly anomalous behavior observed in rare-earth sesquioxides, Ta(2)O(5)-TiO(2) mixed oxides, lanthanum aluminate and dilute Zr(x)Si(y)O(2) is discussed in terms of the atomic structure. Physical examination of the relevant properties of these materials should lead to an understanding of how to engineer the dielectric constant.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2006
Accession Number
ADA466915

Entities

People

  • A. Pineda
  • Arthur H. Edwards
  • R. A. Devine
  • T. Busani

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Aluminates
  • Atomic Structure
  • Chemistry
  • Department Of Defense
  • Dielectric Permittivity
  • Dielectric Properties
  • Dielectrics
  • Elements
  • Engineers
  • Information Operations
  • Lanthanum
  • Materials
  • Military Research
  • Physical Examination (Medicine)
  • Physics

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Microwave Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene