MEMS Shear Stress Sensors: Promise and Progress
Abstract
This paper reviews existing microelectromechanical systems (MEMS)-based shear stress sensors. The promise and progress of MEMS scaling advantages to improve the spatial and temporal resolution and accuracy of shear stress measurement is critically reviewed. The advantages and limitations of existing devices are discussed. Finally, unresolved technical issues are summarized for future sensor development.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 2004
- Accession Number
- ADA467470
Entities
People
- Catherine B. Mcginley
- Louis N Cattafesta
- Mark Sheplak
- Toshikazu Nishida
Organizations
- University of Florida