Materials on the International Space Station Experiment (MISSE): Optical Analysis of Molecular Contamination on PEC1 Tray 2

Abstract

Silicon wafers were mounted on the exterior of the International Space Station as a part of MISSE. Post-flight ellipsometry and reflectometry were employed to show that the silicon wafers gained about a 420-A-thick layer of a silica-like contaminant with BRDF scatter values around 1 x l0% per steradian.

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Document Details

Document Type
Technical Report
Publication Date
Feb 20, 2007
Accession Number
ADA468592

Entities

People

  • C. J. Panetta
  • J. D. Barrie
  • P. D. Fuqua

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Contamination
  • Contracts
  • Environment
  • Materials
  • Materials Laboratories
  • Measurement
  • Oxides
  • Oxygen
  • Reflectance
  • Reflection
  • Reflectometry
  • Silicon Dioxide
  • Space Environments
  • Space Stations
  • Space Systems
  • Spacecraft

Readers

  • Aerospace Test and Evaluation
  • Materials Science
  • Thin Film Deposition Science.

Technology Areas

  • Space