Atomic Force Microscopy Based Eddy Current Imaging and Characterization of Composite and Nanocomposite Materials (Preprint)
Abstract
Atomic Force Microscope (AFM) based eddy current imaging technique has been used to characterize carbon fiber reinforced composites and carbon nanofibers nanocomposite. The surface topography and eddy current images of the same region of the sample acquired at the same time are presented. While the contrast in AFM images is due to surface topography variations, the contrast in the eddy current images is due to the local variation in the electrical conductivity of the sample. The results show that the combined techniques of AFM and eddy current imaging can be used effectively to investigate the distribution, dispersion of the carbon fibers in the polymer matrix and the fiber matrix interphase. An enhanced contrast at the interface between the fiber and the matrix has been observed in the eddy current images. The implications of the improved contrast in eddy current images and its application to investigation of fiber-matrix interface/interphase in carbon fiber polymer matrix composites is discussed.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 2007
- Accession Number
- ADA469299
Entities
People
- Don Klosterman
- Kumar V. Jata
- Mark P. Blodgett
- Shamachary Sathish
- Vijayaraghava Nalladega
Organizations
- University of Dayton