Simulated Frequency and Force Modulation Atomic Force Microscopy on Soft Samples

Abstract

This report was generated as part of a Student Temporary Employment Program Internship from July 2006 through June 2007. The report presents basic didactic concepts and reviews recent progress in the scientific literature on atomic force microscopy (AFM). A new AFM technique is studied. The novel AFM approach is based on force and frequency modulation (FFM-AFM) that enables nondestructive AFM measurements of soft samples such as biological materials in solution. The vibrational properties of the AFM cantilever probe are examined to determine extermal conditions that the sample is likely to experience.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2007
Accession Number
ADA469876

Entities

People

  • Joshua C. Crone
  • Peter W. Chung
  • Santiago Solares

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Cantilever Beams
  • Carbon Nanotubes
  • Computational Science
  • Equations
  • Frequency
  • Frequency Modulation
  • Frequency Shift
  • Materials
  • Measurement
  • Microscopy
  • Military Research
  • Modulation
  • Numerical Integration
  • Resonance
  • Resonant Frequency
  • Scientific Literature
  • Simulations

Readers

  • Occupational Health and Safety.
  • Radio communications and signal processing.
  • Technical Research and Report Writing.