Synchrotron White Beam X-Ray Topography Characterization of LGX and SXGS Bulk Single Crystals, Thin Films and Piezoelectric Devices
Abstract
This project comprised a program of research aimed at applying the technique of Synchrotron White Beam X-ray Topography (SWBXT), supplemented by the complementary technique of High Resolution Triple-Axis X-ray Diffraction (HRTXD), to the determination of defect and general distortion distributions in novel LGX piezoelectric crystals with a view to enabling improvement in crystal quality and consequently in piezoelectric device performance. The LGX family of compounds, which includes langanite, LGS (La3Ga5SiO14), and its isomorphs, langanite or LGN (La3Ga5.5Nb0.5O14) and langatate or LGT (La3Ga5.5Ta0.5O14), as well as several other variants, are of current interest for application as bulk wave resonators for precision oscillators, with all these materials exhibiting high piezoelectric coupling, low acoustic loss (high Q) and temperature compensation. However, the influence of crystal quality on piezoelectric properties, for example, on mode shapes dictates that high quality crystals are required for this technology to reach full potential. This requires collaboration between crystal growers and characterizers to gain an understanding of the defect content of the crystals and to enable optimization of growth parameters. To this end, detailed SWBXT studies will be carried out on: (1) bulk LGX crystals grown using the Czochralski technique, (2) homo- and heteroepitaxial thin films of LGX, and (3) various LGX resonator structures including Surface Acoustic Wave (SAW) resonators. (4) Selected Quartz Resonators (5) SiC substrates/epilayers.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 27, 2007
- Accession Number
- ADA470957
Entities
People
- Michael Dudley
Organizations
- State University of New York