Vapor Sensor Realized in an Ultracompact Polarization Interferometer Built of a Freestanding Porous-Silicon Form Birefringent Film

Abstract

Abstract A novel vapor sensor that uses polarization interferometry in a form birefringent porous-silicon film is introduced, analyzed, and experimentally characterized. Simulations and analysis of accuracy, versatility, stability, and control of dynamic range of the device are provided. The simulation accurately predicts the polarization interference signal, which is used to estimate the effective refractive indexes characterizing the form birefringence of a porous-silicon film with 0.001 accuracy. The device was tested for the detection of heptane concentration in a range of 342 20 000 ppm (=2.0%).

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2005
Accession Number
ADA471430

Entities

People

  • Beom-hoan O
  • Michael J. Sailor
  • Rong Liu
  • Yang Y. Li
  • Yeshaiahu Fainman

Organizations

  • Inha University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Analyzers
  • Angle Of Incidence
  • Birefringence
  • Computer Simulations
  • Detection
  • Detectors
  • Dynamic Range
  • Engineering
  • Interferometers
  • Measurement
  • Measuring Instruments
  • Optical Detection
  • Optical Detectors
  • Optics
  • Polarization
  • Simulations

Readers

  • Computational Modeling and Simulation
  • Optical Physics and Photonics.
  • Thin Film Deposition Science.