An Efficient and Accurate Method of Estimating Substrate Noise Coupling in Heavily Doped Substrates

Abstract

This thesis presents a Z-parameter based model to predict the substrate noise coupling between two contacts in a heavily doped substrate for frequencies less than 2 GHz. The empirical model is scalable with contact size and spacings between the contacts and model parameters can be readily extracted from simulated or measured data. The error is within acceptable limits and computational costs associated with extraction of substrate parasitics is significantly reduced by using this model compared to numerical techniques. An application of the model to analyze the substrate noise coupling between a digital and analog block also is demonstrated.

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Document Details

Document Type
Technical Report
Publication Date
Aug 24, 2005
Accession Number
ADA471477

Entities

People

  • Sasi K. Arunachalam

Organizations

  • Oregon State University

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Accuracy
  • Amplifiers
  • Boundary Element Methods
  • Calibration
  • Computers
  • Couplings
  • Curve Fitting
  • Electrical Engineering
  • Engineering
  • Extraction
  • Fittings
  • Frequency
  • Geometry
  • Impedance
  • Measurement
  • Resistance
  • Simulations

Readers

  • Computational Modeling and Simulation
  • Integrated Circuit Design and Technology.
  • Thin Film Deposition Science.

Technology Areas

  • Space