Design Techniques for Radiation Hardened Phase-Locked Loops

Abstract

Spacecraft experience radiation in the course of their operation and all the electronic equipment on-board these vehicles has to be designed to withstand the effects of this radiation. This thesis describes the effects of total ionization dose (TID) and single-event transients (SET) in phase-locked loops -- an important circuit block for communication circuits and clock generation. The design of a digital phase-locked loop made tolerant to SET through redundancy and error correction techniques is described. Digital phase-locked loops also can incorporate self-calibration techniques to compensate for the effects of TID. A linear analysis is presented for the design of digital phase-locked loops. This digital phase-locked loop was fabricated in the Honeywell 0.35 micrometer SOI CMOS process.

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Document Details

Document Type
Technical Report
Publication Date
Aug 23, 2005
Accession Number
ADA471478

Entities

People

  • Anantha N. Nemmani

Organizations

  • Oregon State University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Calibration
  • Computers
  • Converters
  • Detectors
  • Digital Circuits
  • Electrical Engineering
  • Electronic Components
  • Electronic Equipment
  • Energy Consumption
  • Energy Transfer
  • Engineering
  • Oscillators
  • Phase Detectors
  • Radiation
  • Radiation Hardening
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Physics

Readers

  • Control Systems Engineering.
  • Integrated Circuit Design and Technology.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems
  • Space
  • Space - Spacecraft Maneuvers