Research and Development of Coated Conductors Using Metal Organic Chemical Vapor Deposition

Abstract

This is a new 3-year program to build on the success of the previously funded AFOST Contract FA9550-04-C-0020. In the last year of this program, we made major progress in both objectives of the program. We fabricated films of different thickness by our standard MOCVD processes and worked with our collaborators (ORNL, LANL, FSU,) to understand the microstructural reasons for the Ic performance using a variety of advanced characterization tools. We then modified our MOCVD process using a multipass technique to improve Ic performance in thick films. We modified rare-earth composition to improve critical current performance. This report addresses progress made in the first 3 months of the new program.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Sep 01, 2007
Accession Number
ADA473046

Entities

People

  • V. Selvamanickam

Tags

Communities of Interest

  • Biomedical
  • Human Systems

DTIC Thesaurus Topics

  • Chemical Vapor Deposition
  • Contracts
  • Current Density
  • Electron Microscopes
  • Emission Spectroscopy
  • Field Emission
  • Films
  • High Resolution
  • Materials
  • Materials Processing
  • Measurement
  • Scanning Electron Microscopes
  • Spectroscopy
  • Standards
  • Thick Films
  • Thickness
  • Vapor Deposition

Readers

  • Research Science/Academic Research
  • Semiconductor Device Technology
  • Technical Research and Report Writing.