Measurement of Thermal Properties of Infrared Materials (Preprint)

Abstract

The thermal properties of several semiconductors including InAs, InSb, Si and HgCdTe have been measured using the laser flash method. The values of the thermal diffusivity, specific heat, and thermal conductivity are reported for these materials at temperatures ranging from 90 to 400K.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 2007
Accession Number
ADA473737

Entities

People

  • Emily M. Heckman
  • Leonel P. Gonzalez
  • Shekhar Guha

Organizations

  • General Dynamics

Tags

Communities of Interest

  • Advanced Electronics
  • C4I
  • Sensors

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Air Force Research Laboratories
  • Conductivity
  • Detectors
  • Diffusivity
  • Government Procurement
  • Governments
  • Heat Capacity
  • Infrared Detectors
  • Materials
  • Measurement
  • Semiconductors
  • Specific Heat
  • Thermal Conductivity
  • Thermal Diffusivity
  • Thermal Properties

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics