Femtosecond Laser Threshold and Nonlinear Characterization in Bulk Transparent SiC Materials (Preprint)

Abstract

Semi-insulating and conducting SiC crystalline transparent substrates were studied after being processed by femtosecond laser radiation. Z-scan and damage threshold experiments were performed on both SiC bulk materials to determine each samples' nonlinear and threshold parameters. "Damage" in this text refers to an index of refraction modification as observed visually under an optical microscope. In addition, a study was performed to understand the damage threshold as a function of numerical aperture.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 2007
Accession Number
ADA473741

Entities

People

  • Chris Brewer
  • G. L. Desautels
  • Marc Finet
  • Mark Walker
  • Matt Whitaker
  • Peter Powers
  • Scott Ristich
  • Shane Juhl

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies
  • Sensors

DTIC Thesaurus Topics

  • Advanced Materials
  • Air Force
  • Air Force Facilities
  • Air Force Research Laboratories
  • Bulk Materials
  • Femtosecond Lasers
  • Femtosecond Time
  • Government Procurement
  • Governments
  • Information Exchange
  • Information Systems
  • Lasers
  • Materials
  • Military Research
  • Numerical Aperture
  • Silicon Carbide
  • United States

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Semiconductor Device Technology
  • Structural Health Monitoring of Composite Structures.

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Graphene