Characterization of Temperature Dependent Index of Refraction and Thermo-Optic Coefficient for InAs and InSb (Preprint)

Abstract

We demonstrate the use of interferometric techniques to measure the temperature dependence of the index of refraction and thermo-optic coefficient of infrared wafer-shaped optical materials, and report our results for InAs and InSb.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2006
Accession Number
ADA475493

Entities

People

  • Christopher Dirocco
  • Glen D. Gillen
  • Peter Powers
  • Shekhar Guha

Organizations

  • University of Dayton

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Air Force
  • Air Force Facilities
  • Air Force Research Laboratories
  • Coefficients
  • Fabry Perot Interferometers
  • Government Procurement
  • Governments
  • Information Exchange
  • Interferometers
  • Materials
  • Measurement
  • Military Research
  • Optical Materials
  • Refraction
  • Refractive Index
  • United States

Fields of Study

  • Materials science
  • Physics

Readers

  • Neurological Diseases/Conditions/Disorders
  • Semiconductor Device Technology
  • Spectroscopy.