Measurements of Secondary Electron Yield from Materials with Application to Depressed Collectors

Abstract

This final technical report reviews the research activities during the period of this grant, emphasizing the final year. The key finding of our study is that the total incident electron dose is a critical parameter affecting secondary electron emission (SEE). A completely automated experimental set-up was implemented that allowed for measurement of secondary electron yield (SEY) as a function of beam energy, angle of incidence of primary electrons, electron dose, and time. We present SEY data for copper, plasma-sprayed boron carbide, and titanium nitride samples with principal attention given to the dose dependence. Experiments were conducted in the energy range 5 - 1000 eV using DC voltages. Modified empirical formulas are proposed that incorporate the dose effect and match the experimental measurements.

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Document Details

Document Type
Technical Report
Publication Date
Apr 04, 2008
Accession Number
ADA480575

Entities

People

  • Edl Schamiloglu
  • Mark Gilmore

Organizations

  • University of New Mexico

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Angle Of Incidence
  • Boron Carbides
  • Carbides
  • Charged Particles
  • Chemical Reactions
  • Chemistry
  • Electron Emission
  • Electron Energy
  • Electrons
  • Emission
  • High Power Microwaves
  • Materials
  • Measurement
  • Metals
  • Photoexcitation
  • Surface Chemistry
  • Surface Properties

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Pulsed Power and Plasma Physics.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics