Metrics for TRUST in Integrated Circuits
Abstract
In this paper we report on metrics approaches adapted for the DARPA TRUST in ICs program. A metrics approach initially focused on detection of malicious alterations in integrated circuit die has been adapted for use on FPGA bitstreams and the ASIC design process. We also discuss metrics for techniques focused on prevention of malicious alterations.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 2008
- Accession Number
- ADA482033
Entities
People
- Daniel P. Wilt
- John P. Devale
- Richard C. Meitzler
Organizations
- Johns Hopkins University