Monolithic Integration of Resonant Interband Tunneling Diodes and High Electron Mobility Transistors in the InAs/GaSb/AlSb Material System
Abstract
InAs/AlSb high electron mobility transistors (HEMTs) and resonant interband tunneling diodes (RITD) with AlSb barriers and GaSb wells were grown in a single heterostructure by molecular beam epitaxy. The resulting HEMTs exhibit excellent dc and microwave performance at low drain voltages with an intrinsic unity-current-gain cutoff frequency of 220 GHz. The RITD performance is comparable to RITDs grown directly on InAs substrates, with peak current densities above 10(exp 4) A/sq cm and peak-to-valley ratios near 11 for 15 Angstrom AlSb barriers. The results represent an important step toward the fabrication of high-speed, low-power logic circuits in this material system.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 2000
- Accession Number
- ADA482490
Entities
People
- Allan S. Bracker
- Brian R. Bennett
- Doewon Park
- R. Bass
- Richard Magno
- Ronaldd D. Schrimpf
Organizations
- United States Naval Research Laboratory