Surface Reconstruction Phase Diagrams for InAs, AlSb, and GaSb

Abstract

We present experimental flux-temperature phase diagrams for surface reconstruction transitions on the 6.1As compound semiconductors. The phase transitions occur within or near typical substrate temperature ranges for growth of these materials by molecular beam epitaxy and therefore provide a convenient temperature standard for optimizing growth conditions. Phase boundaries for InAs (0 0 1) [(2*4)->(4*2)], AlSb (0 0 1) [c(4*4)->(1*3)], and GaSb (0 0 1) [(2*5)_>(1*3)] are presented as a function of substrate temperature and Group V-limited growth rate (proportional to flux), for both cracked and uncracked Group V species. We discuss differences between materials in the slopes and offsets of the phase boundaries for both types of Group V species.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2000
Accession Number
ADA483102

Entities

People

  • Allan S. Bracker
  • B. R. Bnnett
  • James C. Culbertson
  • M. J. Yang
  • W. J. Moore

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Crystal Growth
  • Diagrams
  • Electrons
  • Epitaxial Growth
  • Ionization Gages
  • Mass Spectrometry
  • Materials
  • Measurement
  • Phase
  • Phase Diagrams
  • Phase Transformations
  • Semiconductors
  • Spectra
  • Temperature Gradients
  • Transition Temperature
  • Transitions

Fields of Study

  • Materials science

Readers

  • Materials Science (Mechanical Engineering).
  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene