On the Power Dependence of Extraneous Microwave Fields in Atomic Frequency Standards
Abstract
We show that the frequency bias caused by distributed cavity phase has a strong dependence on microwave power. We also show that frequency biases associated with microwave leakage have distinct signatures in their dependence on microwave power and the physical location of the leakage interaction with the atom.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 2005
- Accession Number
- ADA483885
Entities
People
- E. A. Donley
- F. Levi
- J. H. Shirley
- N. Ashby
- Steven R. Jefferts
- T. P. Heavner
Organizations
- National Institute of Standards and Technology