Characterization and Reduction of Number Dependent Sensitivity in Multi-pole Linear Ion Trap Standards

Abstract

The Multi-pole Linear Ion Trap Standard developed at the Jet Propulsion Laboratory has demonstrated excellent short and long-term stability and improved immunity from two of its remaining systematic effects, the second order Doppler shift and second order Zeeman shift. The technology has also demonstrated long-term operation in the field. In this paper we discuss the LITS systematic effects and present the characterization and reduction of the primary shifts and their dependence on ion number.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 2005
Accession Number
ADA485012

Entities

People

  • E. A. Burt
  • R. L. Tjoelker

Organizations

  • California Institute of Technology

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Control Systems
  • Doppler Effect
  • Frequency
  • Frequency Shift
  • Frequency Standards
  • Ion Traps
  • Jet Propulsion
  • Magnetic Fields
  • Measurement
  • Partial Pressure
  • Sensitivity
  • Standards
  • Time Intervals

Readers

  • Mathematics or Statistics
  • Optical Physics and Photonics.
  • Parasitology and Pharmacology of Malaria.