Characterization of Periodically Poled Nonlinear Materials Using Digital Image Processing

Abstract

For as long as periodically poled devices have been produced, there has been a need to evaluate and improve their performance. A new approach based on image processing across an entire z+ or z- surface of a poled crystal allows for better quantification of the underlying domain structure and directly relates to device performance. The poled regions are determined from the images and this mapping is then used to determine an effective nonlinear d-coefficient. Experimentally validated measurements are shown for an optical parametric generator setup. Future improvements in the poling process should be possible by using this technique to produce quantifiable metrics to compare device fabrication iterations, which has applications in Quality Assurance as well as device development.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 2008
Accession Number
ADA487003

Entities

People

  • James R. Alverson

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Biomedical
  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Sensors

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Coordinate Systems
  • Detection
  • Detectors
  • Digital Image Processing
  • Digital Images
  • Electro-Optical Sensors
  • Image Processing
  • Images
  • Infrared Countermeasures
  • Materials
  • Measurement
  • Optical Detectors
  • Optical Materials
  • Piezoceramics
  • Refractive Index

Readers

  • Materials Science and Engineering.
  • Radar Systems Engineering.
  • Software Engineering.