ONR D&I Electronics Technology Programs
Abstract
Program Status: One of the D&I program goals is to develop greatly improved field-plated MMW GaN HEMT devices with high ft/fmax, which will improve gain/PAE and output power of GaN HEMT MMIC PAs simultaneously. The 6-wafer MMW GaN MMIC lot is competed with the front-side processing and waiting for the back-side processing.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 2008
- Accession Number
- ADA487453
Entities
People
- Jeong Moon
Organizations
- HRL Laboratories