Rare-Earth Doped Gallium Nitride (GaN)- An Innovative Path Toward Area-scalable Solid-state High Energy Lasers Without Thermal Distortion
Abstract
We have demonstrated, for the first time, in situ neodymium (Nd) doping of gallium nitride GaN by plasma-assisted molecular beam epitaxy (PA-MBE). The Nd doping is controlled by the GaN growth conditions and the Nd effusion cell temperature. The Rutherford backscattering spectroscopy (RBS) and secondary ion mass spectrometry (SIMS) data indicated Nd doping as high as ~8 at. %, with no evidence of phase segregation identified by x-ray diffraction (XRD) for Nd up to ~1 at. %. The Nd incorporation reached a limit while maintaining crystal quality. Strong room-temperature (RT) luminescence corresponded to the three characteristic Nd emission multiplets, with the Stark energy levels resolved by photoluminescence (PL) and photoluminescence excitation (PLE). Although the 4f electrons were well shielded from the host material, we were still able to observe weak electron-phonon interactions. Spectral correlation of the multiplets for above (325 nm) and below (836 nm) GaN bandgap excitation implied enhanced substitutional doping at the Ga site. The highest RT PL intensities corresponded to a doping level between 0.1?1 at. %. The enhanced substitutional doping at the Ga site and low optical loss in waveguide structures suggests GaN:Nd with a high enough Nd concentration has significant potential for use in simple, area-scalable, RT, diode-pumped, solid-state high energy lasers (HELs).
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 2009
- Accession Number
- ADA496417
Entities
People
- Mark Dubinskiy
- Michael Wraback
Organizations
- United States Army Research Laboratory