Spatially Resolved Photocurrent Mapping of Operating Organic Photovoltaic Devices Using Atomic Force Photovoltaic Microscopy

Abstract

A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaic microscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2008
Accession Number
ADA499735

Entities

People

  • A. W. Hains
  • B. J. Leever
  • L. S. Pingree
  • M. C. Hersam
  • M. D. Irwin
  • M. F. Durstock
  • T. J. Marks

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force Research Laboratories
  • Composite Materials
  • Conductive Polymers
  • Electrical Properties
  • Electron Microscopes
  • Electron Microscopy
  • Films
  • Light Sources
  • Materials
  • Materials Science
  • Microscopes
  • Microscopy
  • Military Research
  • Optics
  • Organic Light Emitting Diodes
  • Short Circuits
  • Solar Cells

Readers

  • Mycotoxin ecology in Amazonian ecosystems.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics