Specimen Heterogeneity Analysis; A Primer (PREPRINT)

Abstract

The characterization and the quantification of specimen heterogeneity is an issue that is intimately related to the precision, or variability, of the x-ray measurements that are made on a specimen. While the precision of electron probe micro-analysis (EPMA) techniques has been studied thoroughly over the past 55 years, it is less often discussed in relation to the topic of specimen heterogeneity. For the beginning analyst, the relationship between the statistical interpretation of the data and the application of the various heterogeneity equations can be confusing. The NIST-Analysis of Variance (ANOVA) procedure provides a rigorous method for evaluating heterogeneity within research materials; however, a quick estimate of the heterogeneity range is often all that is required for a single specimen that is not intended to be used as a standard reference material. For these instances, legacy equations, such as the one proposed by Goldstein, et al, have been suggested because they are quick and easy to apply.

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Document Details

Document Type
Technical Report
Publication Date
Feb 01, 2008
Accession Number
ADA501129

Entities

People

  • F. Meisenkothen
  • J. J. Donovan

Organizations

  • Universal Energy Systems

Tags

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Analysis Of Variance
  • Data Sets
  • Electron Microscopy
  • Electron Probes
  • Electrons
  • Equations
  • Heterogeneity
  • Homogeneity
  • Materials
  • Measurement
  • Microscopy
  • Military Research
  • Precision
  • Standards
  • X Rays

Readers

  • Regression Analysis.
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics