Microstructural Evolution and Tensile Properties of SnAgCu Mixed with Sn-Pb Solder Alloys (Preprint)

Abstract

The effect of incorporating eutectic Sn-Pb solder with Sn-3.0Ag-0.5Cu (SAC 305) Pb-free solder on the microstructure and tensile properties of the mixed alloys was investigated. Alloys containing 100, 75, 50, 25, 20, 15, 10, 5 and 0 wt. % SAC 305, with the balance being Sn-37Pb eutectic solder alloy, were prepared and characterized. Optical and scanning electron microscopy were used to analyze the microstructures while "mini-tensile" test specimens were fabricated and tested to determine mechanical properties at the mm length scale, more closely matching that of solder joints. Microstructural analysis indicated that a Pb-rich phase formed and was uniformly distributed at the boundary between the Sn-rich grains or between the Sn-rich and the intermetallic compounds in the solder. Tensile results showed that mixing of the alloys resulted in an increase in both the yield and the ultimate tensile strength compared to the original solders, with the 50% SAC-50%Sn-Pb mixture having the highest measured strength. Initial investigations indicate the formation and distribution of a Pb-rich phase in the mixed solder alloys as the source of the strengthening mechanism.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2009
Accession Number
ADA503067

Entities

People

  • Brandon Brinkmeyer
  • Fengjiang Wang
  • Matthew O'keefe

Tags

Communities of Interest

  • Biomedical

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Boundaries
  • Electron Microscopy
  • Electronic Equipment
  • Electrons
  • Intermetallic Compounds
  • Manufacturing
  • Materials
  • Materials Science
  • Mechanical Properties
  • Microscopy
  • Microstructure
  • Phase Transformations
  • Scanning Electron Microscopy
  • Tensile Properties
  • Tensile Strength

Fields of Study

  • Materials science

Readers

  • Electrical Engineering
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics