New Ion Trap for Frequency Standard Applications
Abstract
We have designed and built a novel linear ion trap which permits storage of a large number of ions with reduced susceptibility to the second order Doppler effect caused by the RF confining fields. This new trap should store about 20 times the number of ions as a conventional RF trap with no corresponding increase in second order Doppler shift from the confining field. Other comparisons to standard RF ion traps will be made.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1988
- Accession Number
- ADA503708
Entities
People
- G. J. Dick
- J. D. Prestage
- L. Maleki
Organizations
- California Institute of Technology