Stress Gradient Induced Strain Localization in Metals: High Resolution Strain Cross Sectioning via Synchrotron X-Ray Diffraction (POSTPRINT)
Abstract
Strain localization in the presence of a stress gradient is a phenomenon common to many systems described by continuum mechanics. Variations of this complex phenomenon lead to interesting nonlinear effects in materials/engineering science as well as in other fields. Here, the synchrotron based energy dispersive x-ray diffraction (EDXRD) technique is used for high spatial resolution profiling of both compression and tension induced strain localization in important materials/engineering problems. Specifically, compression induced strain localization in shot peened materials and tension induced strain localization in the plastic zones adjoining the faces of a fatigue crack are profiled. The utility of the EDXRD synchrotron technique for nondestructively cross-sectioning strain variations on small length scales is described. While the strain field profiling relies on the shift of the Bragg lines, the data show that plastic deformation regions can also consistently be seen in the broadening of the Bragg peaks through the full width at half maximum parameter.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 2008
- Accession Number
- ADA504053
Entities
People
- J. Skaritka
- K. Sadananda
- Kathleen L. Horvath
- M. Croft
- M. Lakshmipathy
- M. Shepard
- N. Jisrawi
- R. K. Sadangi
- R. L. Holtz
- T. Tsakalakos
- V. Shukla
- Zhaohui Zhong
Organizations
- Air Force Research Laboratory